EMISSIVITY-COMPENSATED RADIATION THERMOMETRY

T. Iuchi, T. Furukawa

Abstract

Emissivities of metals show large periodic type variation with the growth of the oxide film on their surfaces. The emissivitity variations are caused by the interference effect of radiation between the metal surface and the oxide film. In this paper, p-polarized and s-polarized emissivities as well as directional emissivities for a surface composed of metal and metallic oxide film are studied. From both theoretical and experimental considerations, the authors propose an emissivity-compensated radiation thermometry using a total radiometer that can provide an accurate way to avoid the interference effect on emissivity.

Keywords

pyrometry, emissivity, polarization

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IMEKO-WC-2000-TC12-P308.pdf

DOI

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IMEKO TC

TC12 - Temperature and Thermal Measurements

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