DETECTION OF UNEVEN FLATNESS ON LIQUID SURFACE

H. Narahara, H. Suzuki, M. Suga

Abstract

This research is aimed at improving accuracy of stereolithography (Rapid prototyping) system. The objective of this paper is to detect the flatness of freeform liquid surface. The principle of measurement is performed by obtaining grating image of total reflection from freeform liquid surface. The detection is performed by two steps, coarse detection and fine one. Coarse detection is used for searching widely deformed area and fine detection is used for verifying flatness of freeform liquid surface. The phase detection of grating image is based on Linear Digital Phase-Locked Loop (L-DPLL).

Keywords

rapid prototyping, total reflection, flatness

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IMEKO-WC-2000-TC14-P387.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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