NEW APPROACH IN INTERFEROMETRIC LENGTH MEASUREMENTS
Abstract
Interferometric length measurements without parallax error, based on the phenomenon of the reproducible wringing, are demonstrated. Using reproducible wringing together with the slave-block technique, accuracy level below 1 nm can be obtained for blocks of a few mm length with small flatness deviation. Phase change correction determination with sub-nm uncertainty is achieved for blocks up to 100 mm. Comparing the results of the double-ended method on a transparent reference plate with the reproducible wringing results, measurements without parallax error can be performed in the general case with a nm uncertainty.
Event details
- Event
- XVI IMEKO World Congress
- Place
- Vienna, AUSTRIA
- Time
- 25 September 2000 - 28 September 2000