CMM PROBE TESTING BY MEANS OF A LOW FORCE SENSOR

A. Wozniak, M. Dobosz

Abstract

The method and the computerised set-up for the accuracy of touch trigger probe testing, outside CMM is discussed. A high resolution interference displacement transducer with a low measuring force is applied. The results of preliminary tests of TP2-5W and TP6 (Renishaw) probe in XYZ space are shown. The metrological characteristics of the probe are analysed.

Keywords

coordinate measuring machines; touch trigger probe

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IMEKO-WC-2000-TC14-P410.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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