MEASURING OF EFFECTIVE RESOLUTION OF Σ-Δ ADC

J. Holub, J. Vedral

Abstract

Measurement and testing methodology for Σ-Δ Analog-to-Digital converters with nominal resolution 16 (24) bits is presented. The dependancies of effective resolution on the first notch frequency and gain are given.

Keywords

ADC, testing, Σ-Δ modulation

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IMEKO-WC-2000-EWADC-P624.pdf

DOI

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