SINE WAVE TEST OF ADC'S: MEANS FOR INTERNATIONAL COMPARISON
Abstract
ADC data sheets and test methods are not yet standardized. A new attempt to create a common platform for these is the draft standard IEEE-STD-1241. However, the methods described in this standard need an extra effort from the user to exactly understand and implement them. It is therefore very reasonable to provide programs which implement these methods, and allow manufacturers and users to use them. This assures that the same characterizing quantities will be used for the same purpose by everyone.<BR />The first attempt for this was a LabView program announced in 1999. In this paper another implementation is presented, running under MATLAB. This will hopefully extend the number of the users of the methods described in the standard.
Event details
- Event
- XVI IMEKO World Congress
- Place
- Vienna, AUSTRIA
- Time
- 25 September 2000 - 28 September 2000