SYSTEM FOR DYNAMIC TESTING OF ANALOG TO DIGITAL MODULES

J. Roztocil, V. Haasz, J. Brossmann

Abstract

An automated system for dynamic testing of ISA, PCI and VXI modules in frequency range up to 1 MHz developed at Department of Measurement of FEE CTU Prague is presented. The application of the Hewlett-Packard E1430A high precision VXIbus digitizer for evaluation of testing signals is described.

Keywords

AD modules dynamic testing, test system, VXI bus

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IMEKO-WC-2000-EWADC-P640.pdf

DOI

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