THE PROBLEM OF THE STANDARD CHARACTERIZATION OF ADC AND DIGITIZING WAVEFORM RECORDERS

M. Savino

Abstract

The problem of the metrological qualification of data acquisition systems and of waveform recorder is a fundamental issue for both users and manufacturers of digital instruments.<BR />The need for an improved industrial standard leading to unification and standardization in this field is a very pressing requirement. Users have to receive technical specifications written in standard format and manufacturers to obtain them following standard test procedure.<BR />The Main goal of this paper is to underline the need of unifying the modeling, identification and optimization of ADC-based systems, by minimizing the number of the experimental procedures to be employed.

Keywords

Digital Waveform Recorders, Analog-to-Digital Converters, data acquisition systems, metrological qualification

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IMEKO-WC-2000-EWADC-P646.pdf

DOI

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