EXTRACTING FULL INFORMATION FROM MEASURED ADC DATA

László Balogh, István Kollár, Linus Michaeli, Ján Šaliga, Jozef Lipták

Abstract

ADC testing is often done using sine wave excitation (see e.g. IEEE standard 1241). The measured data are fitted in least squares sense by a sine wave, and the residuals can be analyzed further. In recent papers, it has been recognized that even more (and more precise) information can be extracted by the solution of the maximum likelihood equations. This can be considered as an improvement to the three-parameter and four-parameter fits. Further investigations lead to the statement that the same principle can be extended to any measurement which uses an excitation signal which can be described with a few parameters. A candidate for this is using an exponential signal, with 3 parameters: start value, end (steady-state) value, and time constant. The maximum likelihood (ML) equations yield a solution for these more accurate than least squares (LS) fitting.

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IMEKO-IWADC-2010-121.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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