USING OF PULSE SIGNAL Sinx/x FOR DAC TESTING
Abstract
In this paper the qualities of short methods for testing dynamical parameters internal ADCs and DACs with impulses Multi-Tone and Sinx/x signal are analyzed. Practically examples are compared with standard Single-Tone Fourier Transform Test Method. This methods finds an application in the industry in less demanding economical short testing.
Event details
- Event
- IWADC 2011
- Technical Committee
- TC4
- Place
- Orvieto, ITALY
- Time
- 30 June 2011 - 1 July 2011
- Website
- http://www.iwadc2011.diei.unipg.it/Sito/IWADC2011.html