On the design of truncated sequential sampling plans
Abstract
The paper presents a study, via Monte Carlo simulations, of the effect of truncation in sequential sampling plans. In sequential sampling plans, truncation is needed to avoid an excessive sample size, which can occur in same cases: on the other hand, truncation affects both the Operating Characteristic (OC) and the Average Sample Number (ASN). In the paper, the approximate analytical formulas used in the literature to determine OC and ASN are compared with the actual curves obtained via Monte Carlo simulations, taking into consideration three different truncation thresholds. Besides, a fourth truncation threshold is empirically determined: it yields approximately the best correspondence between theoretical and Monte Carlo OC and ASN.
Event details
- Event
- TC10 Workshop 2013
- Technical Committee
- TC10
- Place
- Florence, ITALY
- Time
- 6 June 2013 - 7 June 2013
- Website
- http://www.imekotc10-florence.org/