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Time Domain Processing of Pulsed Differential Eddy Currents Testing Signals

Luís Rosado, Pedro Ramos, Moisés Piedade

Abstract

The use of pulsed stimulus on Eddy Currents Testing is currently applied on multiple applications from conductivity measurements to defects detection on metallic parts. This type of stimulus is frequency rich since it is composed by multiple harmonics and this allows testing with different depth concentration of the eddy currents as they are subject to the skin effect. In this paper, pulsed stimuli are used while testing with a custom probe. The probe output signals are acquired and processed digitally in the time domain using a simple feature, its RMS value. Two-dimensional scans were performed allowing the imaging of a tested metallic part with different defects.

Keywords
Eddy Currents Testing, Pulsed Stimulus, Time Domain Processing
Download
IMEKO-TC4-2013-086.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Symposium 2013
Technical Committee
TC4
Email
joaquin.del.rio@upc.edu
Place
Barcelona, SPAIN
Time
18 July 2013 - 19 July 2013
Website
http://www.imeko2013.es/

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