Improving the result of the histogram test using a fast sine fit algorithm

Vilmos Pálfi, István Kollár

Abstract

To accurately characterize an ADC using the sine-wave histogram test, the input signal has to meet strict conditions: sampling has to be coherent, and the number of periods has to be relative prime to the number of samples (see IEEE standard 1241). Due to the limited precision of the sine frequency and of the sampling frequency, such conditions should be checked from the measured signal. In this paper a new method is presented which is able to check the fulfilment of the above conditions from the output signal, and if the signal fails to fulfil the conditions, the number of samples to be neglected in the measurement can be determined to improve the quality of the histogram test result.

Keywords

coherence, relative prime condition, histogram test, frequency estimation

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IMEKO-TC4-2013-118.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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