A Fault Diagnosis Method for Analog Parts of Embedded Systems Based on Time Response and Identification Curves in the 3-D Space

Zbigniew Czaja

Abstract

A new 3-D version of the new fault diagnosis method of analog parts in embedded mixed microsystems based on microcontrollers is presented. It has the following advantages: measurements of the CUT can be made using only internal resources of popular microcontrollers, the diagnosis procedure does not require big computing power and the codes of its procedure do not occupy much space in the program memory of the microcontroller.

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IMEKO-TC4-2005-068.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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