FPGA AUTO CONFIGURATION BASED ON AUTOMATED TEST EQUIPMENT

Qian Liu, Junwei Sun, Dan Wang

Abstract

FPGAs (Field Programmable Gate Arrays) are highly integrated devices that can be programmed into variable functions. The application-level testing of FPGAs usually requires multiple reconfigurations and relevant functional tests respectively through ATEs (Automated Test Equipments). However, test engineers are facing a tough problem to re-configure FPGAs automatically by an ATE instead of interrupting the entire test process between every single functional test to change the configuration file manually. This paper takes example for XILINX Virtex-E series, presents two different methods for FPGA auto configuration based on an ATE and discusses both advantages and disadvantages of the two methods.

Keywords

auto configuration, JTAG (Joint Test Action Group) interface, boundary scan

Download

IMEKO-TC4-2011-019.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings