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PRECISION WAVELENGTH METROLOGY WITH A FOURIER TRANSFORM SPECTROMETER

Damir Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti

Abstract

We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 10<sup>5</sup>. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of <sup>198</sup>Hg.

Keywords
Fourier Transform Spectrometer, wavenumber calibraton, Hg, pressure shift
Download
PWC-2003-TC2-016.pdf
DOI
-
IMEKO TC
TC2 - Photonics

Event details

Event
XVII IMEKO World Congress
Place
Dubrovnik, CROATIA
Time
22 June 2003 - 28 June 2003
Website
http://www.hmd.hr/imeko/

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