PRECISION WAVELENGTH METROLOGY WITH A FOURIER TRANSFORM SPECTROMETER
Abstract
We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 10<sup>5</sup>. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of <sup>198</sup>Hg.
Event details
- Event
- XVII IMEKO World Congress
- Place
- Dubrovnik, CROATIA
- Time
- 22 June 2003 - 28 June 2003
- Website
- http://www.hmd.hr/imeko/