CMM INSPECTION COMBINING TACTILE PROBING AND LASER SCANNING

H. Zhao, N. Van Gestel, P. Bleys, J. P. Kruth

Abstract

Combining contact and non-contact CMM probes provides a promising solution to meet the increasing requirements on complexity and accuracy of dimensional metrology, and benefit inspection performance. However, the automated planning of measurement strategies for such hybrid CMM systems hasn’t been well addressed yet. This paper proposes an automated inspection planning approach for CMM inspection combining tactile probing and laser scanning. The right sensor is first selected for each feature being inspected. According to the selected sensor, the suitable procedures are performed to create the inspect plan automatically. Experiments are carried out to verify the developed approach.

Keywords

CMM, laser scanning, tactile probe, inspection planning, multiple sensors

Download

IMEKO-TC14-2011-35.pdf

DOI

-

IMEKO TC

TC14 - Measurement of Geometrical Quantities

Back to the proceedings