DESIGN OF A MULTI-WAVE STANDARD TO EVALUATE THE FREQUENCY RESPONSE OF CT MEASURING SYSTEMS

Francisco A. Arenhart, Vitor C. Nardelli, Gustavo D. Donatelli, Mauricio C. Porath, Christopher Isenberg, Robert Schmitt

Abstract

This paper presents a multi-wave standard (MWS) designed for evaluating the frequency response in extracting surfaces with CT measuring systems. The characteristics of the MWS were defined using prior knowledge on MWS applied to CT and simulations of the CT extraction operation. With basis on the designed geometry, an aluminium MWS specimen was manufactured. A set of preliminary CT measurements demonstrate the suitability of the designed MWS to characterize the frequency response for surface extraction with CT systems.

Keywords

dimensional metrology, industrial computed tomography, surface extraction, frequency response analysis

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IMEKO-TC14-2013-PL-02.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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