Skip to main content

COMBINED OF THE CLSM-SEM TECHNIQUES FOR MEASUREMENT AND ANALYSIS OF THE SINGLE GRAIN CUTTING SCRATCH ON INCOLOY<sup>®</sup> ALLOY 800HT<sup>®</sup>

Krzysztof Nadolny, Wojciech Kaplonek, Pawel Sutowski

Abstract

Knowledge and understanding of modern machining processes often requires the use of advanced microscopy techniques, such as, among others confocal laser scanning microscopy (CLSM) and scanning electron microscopy (SEM). This work focused on the application of these microscopic techniques for measuring and analyzing of traces made by single abrasive grain cut, formed on the internal cylindrical surface of the sample made of INCOLOY<sup>®</sup> alloy 800HT<sup>®</sup>. The work was divided into two parts. In the first one, the most important types of materials machinability and grindability tests were briefly characterized, with particular reference to issues related with the testing of hard-to-cut materials. The most important properties of the sample as well as the methodology and equipment used in the experimental tests were also described. The second part contains a description of used microscopic techniques and presents selected results of measurements and analyses carried out on the trace shaped by single abrasive grain of microcrystalline sintered corundum SG™. All results presented in this part were obtained using a 3D laser microscope LEXT OLS4000 by Olympus and electron microscope JSM-5500LV by JEOL with dispersive spectrometer module INCAPentaFET-x3 with Si(Li) detector by Oxford Instruments. The results were compared with reference measurements obtained using a opto-digital microscope DSX500 by Olympus.

Keywords
confocal laser scanning microscopy, scanning electron microscopy, scratch test, hard-to-cut materials
Download
IMEKO-TC14-2013-16.pdf
DOI
-
IMEKO TC
TC14 - Measurement of Geometrical Quantities

Event details

Event
TC14 ISMQC 2013
Technical Committee
TC14
Place
Cracow and Kielce, POLAND
Time
11 September 2013 - 13 September 2013
Website
http://www.tu.kielce.pl/ismqc_2013/

Back to the proceedings