Measurement of the magnetization of thin-film samples subjected to mechanical stress

Michael Löffler, Ruben Piepgras, Alexander Sutor, Reinhard Lerch

Abstract

This contribution proposes a method to measure the magnetization of ferromagnetic thin-film samples subjected to mechanical stress. We present our Vector Vibrating Sample Magnetometer and two fixtures that enable the adjustable bending of the ferromagnetic samples during the magnetization measurement. The bending, in turn, results in internal stresses. According to the magnetoelastic effect, the magnetization of ferromagnetic materials depends on internal mechanical stress. Results of two Fe49 Co49 V2 samples are shown which prove the applicability of the proposed method.

Keywords

magnetoelastic effect, thin-film magnetization, vibrating sample magnetometry, magnetostriction

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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