ADC Testing in Standardized and Non-standardized Ways, Using a Unified Framework

Tamás Virosztek, István Kollár

Abstract

Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.

Keywords

ADC testing, standard IEEE-1241, maximum likelihood, parameter estimation, nonlinear least squares

Download

IMEKO-TC4-2014-232.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings