Realiable ADC testing using LabVIEW

Vilmos Pálfi, István Kollár

Abstract

The sinewave histogram test is a commonly used method to characterize nonlinear behavior of A/D converters. Accurate test results require wise choice of the test settings and signal parameters. However, standard methods do not support the recognition of bad parameter settings. In addition, those may provide inaccurate results even when the signal settings are optimal for the histogram test. This paper presents a software which helps handling above problems and deficiencies to guarantee the quality of the test results.

Keywords

ADC testing, histogram test, sine fit, least squares, maximum likelihood

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IMEKO-TC4-2014-259.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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