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DEVELOPMENTS OF MEASUREMENT DUE TO TENDENCIES OF MICROELECTRONICS AND A NEW OPTIMIZATION CRITERION

Eugen-Georg Woschni

Abstract

The paper deals with problems of dynamic behaviour and shows especially how the development of microelectronics influences this field and how to teach this trends applying also heuristic methods and approximations. Using the results of information theory a new optimization criterion is introduced.

Keywords
dynamic behavior, trends, optimization criterion
Download
PWC-2006-TC2-005u.pdf
DOI
-
IMEKO TC
TC2 - Photonics

Event details

Event
XVIII IMEKO World Congress
Place
Rio de Janeiro, BRAZIL
Time
17 September 2006 - 22 September 2006
Website
http://www.metrologia2006.org.br

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