Extreme Value Statistical Characterization of Time Domain Pulse-to-Pulse Measurements

Pasquale Arpaia, Carlo Baccigalupi, Michele Martino

Abstract

An analytical method, based on Extreme Value Theory (EV T), for predicting the worst case repeatability of time domain pulse-to-pulse measurements, modeled as independent and identically distributed random variables, is proposed. The method allows the use of the noise level of a measurement system for predicting the upcoming peak values over a given number of independent observations. The proposed analytical model is compared against simulated distributions generated in Matlab, highlighting satisfying match for any sample size.The simulations are based on a case study on the characterization of a pulsed power supply for the klystron modulators of the Compact LInear Collider (CLIC) under study at CERN.

Keywords

Worst-Case Uncertainty, Worst-Case Repeatability, Extreme Value Theory, Type-A Uncertainty

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IMEKO-TC4-2014-177.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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