ADC test library in LabVIEW

Ján Šaliga, Jozef Lipták, Vojtech Vitkovič, Linus Michaeli

Abstract

ADC testing requires post processing of the acquired data for the estimation of ADC parameters. LabVIEW, as a very popular tool for development of various control and measurement applications, offers many specialized toolkits and libraries, but a specialized library of functions focused at data processing from ADC testing has been missing until now. Therefore, on the basis of previous works and experience, the Authors have developed a specialized library fully programed in LabVIEW, which offers a variety of high and low level functions – VIs or Virtual Instruments – which markedly simplify the development of any data processing software based on standard test methods. One example of application of the library is the demonstration software accessible across the Internet in the form of web application. It enables performing simulated measurements according to all basic ADC test methods (static, histogram, and dynamic, with processing in time domain and spectral domain). By choosing from among different test condition, the user can also learn and find out how the test conditions can affect the achieved results.

Keywords

ADC test, LabVIEW, IEEE 1057, IEEE 1241

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IMEKO-TC4-2014-851.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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