PHASE MEASUREMENT USING A BIAS DERIVATIVE SHIFT TECHNIQUE IN THE PHASE DIFFERENTIATION METHOD
Abstract
An improvement to phase measurement systems based on differentiation filters is proposed. The new technique involves calculations from measurements conducted using two different phase derivative biases. Advantages of the system are that it can be applied to semiopaque objects, and that the effects of non-uniformities in the intensity of the light source are negligible. Computer simulations are performed to verify the effectiveness of the technique.
Event details
- Event
- XVII IMEKO World Congress
- Place
- Dubrovnik, CROATIA
- Time
- 22 June 2003 - 28 June 2003
- Website
- http://www.hmd.hr/imeko/