AN APPROACH FOR NEAR-FIELD MEASUREMENT OF RADIATED EMISSIONS FROM DIGITAL CIRCUITS

Alexandru Salceanu, Constantin Sarmasanu, Mihai Cretu

Abstract

There are presented two E-field and two H-field, versatile, cheap and easy-to-use probes, the effective constructive solutions, the adopted calibration set-up and procedure for measuring their performance factors. As standard reference we used commercial available Agilent and EMCO probes. While trying to improve the EMC characteristics of the prototype of a fluxgate magnetometer, and in consequence near field measuring, problems were encountered. More or less successful attempts are discussed. Some useful techniques and recommendations when dealing with designing PCBs of sensitive equipments are presented.

Keywords

close E and H fields, electromagnetic radiation, PCB design

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IMEKO-TC4-2001-073.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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