EFFECTIVE ALGORITHMS FOR DYNAMIC QUALITY TESTS OF A/D CONVERTERS USING STEP-WISE APPROXIMATED MULTI-CYCLE SINE WAVE
Abstract
When the step-wise approximated multi-cycle sine wave is used as the testing input signal for dynamic quality tests of the A/D converters, the effectiveness, accuracy, and the resolution of the chosen DFT analysis method depends on the proper choice of the method parameters. This paper deals with the theoretical problems of the analysis of the obtained output data of the A/D converter when the above mentioned input signal is applied. The basic principles of effective algorithms are outlined.
Event details
- Event
- TC4 Symposium 2001
- Technical Committee
- TC4
- Place
- Lisbon, PORTUGAL
- Time
- 13 September 2001 - 14 September 2001