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EFFECTIVE ALGORITHMS FOR DYNAMIC QUALITY TESTS OF A/D CONVERTERS USING STEP-WISE APPROXIMATED MULTI-CYCLE SINE WAVE

Raul Land

Abstract

When the step-wise approximated multi-cycle sine wave is used as the testing input signal for dynamic quality tests of the A/D converters, the effectiveness, accuracy, and the resolution of the chosen DFT analysis method depends on the proper choice of the method parameters. This paper deals with the theoretical problems of the analysis of the obtained output data of the A/D converter when the above mentioned input signal is applied. The basic principles of effective algorithms are outlined.

Keywords
A/D converter, dynamic quality test, step-wise approximated sine wave, DFT analysis
Download
IMEKO-TC4-2001-076.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Symposium 2001
Technical Committee
TC4
Place
Lisbon, PORTUGAL
Time
13 September 2001 - 14 September 2001

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