UNCERTAINTY IN THE ADC TRANSITION VOLTAGES DETERMINED WITH THE HISTOGRAM METHOD
Abstract
This paper, presents an innovative study of the uncertainty in the ADC transition voltages, determined by the Histogram Method for ADC testing. The new approach used, allows for a global and uniform overview of this subject, improving the existing knowledge about the workings of the Histogram Method.
Event details
- Event
- TC4 Symposium 2001
- Technical Committee
- TC4
- Place
- Lisbon, PORTUGAL
- Time
- 13 September 2001 - 14 September 2001