PERFORMANCE TESTING OF LOGARITHMIC ANALOG-TO-DIGITAL CONVERTERS

Jorge Guilherme, J. Vital, José Franca

Abstract

This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of converters. Systematic test procedures have been applied to µ-law converters according to the G.711 standard, and to a new type of high-speed true logarithmic pipeline A/D converter. DNL and INL had been defined in the logarithmic domain to allow correct characterization of this class of converters.

Keywords

Logarithmic converter, companding, µ-Law converter

Download

IMEKO-TC4-2001-153.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings