About Fault Diagnosis in Multiport Analog Electronic Circuits Based on Transformation of Multidimensional Spaces

Zbigniew Czaja, Romuald Zielonko

Abstract

Some new methods of fault diagnosis of electronic linear multiports based on bilinear transformation in multidimensional spaces are presented. They are extensions of the input-output methods 3D, 4D and 6D previously elaborated by authors for diagnosis of twoport electronic circuits. The methods can be applied in a diagnosis of linear electronic circuits with the aid of different technologies: conventional measurement systems, testing buses and neural networks. They can be utilised in practice for localisation and identification of single, double and triple faults. Examples illustrating the methods and the neural network application are included.

Keywords

bilinear transformation, fault localisation and identification

Download

IMEKO-TC7-2002-021.pdf

DOI

-

IMEKO TC

TC7 - Measurement Science

Back to the proceedings