DESIGN OF AN OPTICAL SYSTEM FOR EVALUATION OF EDGE CONTOUR OF A DIAMOND CUTTING TOOL

Yuki Shimizu, SungHo Jang, Wei Gao

Abstract

This paper proposes a new optical measurement system for evaluation of a cutting edge profile of a diamond tool. The authors have developed a measurement method of edge contours of diamond tools, in which a micro laser probe scans along the tool edge contour to measure the deviation of the tool edge contour from the scanning path. For further precise tool edge contour measurement with the micro laser probe, the spot diameter of the laser probe needs to be stabilized during the scanning. The proposed optical measurement system includes an optical system for white light scanning interferometer (WLSI) in the laser optical probe system. A rake face of a tool, which normal is set to be parallel to the optical axis of the micro laser probe, is measured by WLSI so that information on both the position of the tool edge with respect to the optical stylus and the scanning path of the optical stylus for tool contour measurement can be acquired. By referring the information acquired by the WLSI, the tool contour would be measured by the optical stylus, while its spot diameter is optimized.

Keywords

measurement, cutting tool, edge contour measurement, white light interferometer

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DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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