PHOTOMETRIC STEREO SYSTEM FOR DETAILED ANALYSIS OF MATERIAL SURFACES
Abstract
This paper describes a photometric stereo system for the measurement of surface topography. The system provides versatile experimental possibilities due to movable multicolor LEDs, movable camera, and a traveling (xy-) table for the sample. We introduce our measurement setup and present analysis of its performance. Our topography maps correlate well with the contact profilometry reference map, and reveal different details of the surfaces depending on the illumination wavelength and pixel size.
Event details
- Event
- XXI IMEKO World Congress
- Place
- Prague, CZECH REPUBLIC
- Time
- 30 August 2015 - 4 September 2015
- Website
- http://imeko2015.org/