AN IDEA OF AN APPROACH TO SELF-TESTING OF MIXED SIGNAL SYSTEMS BASED ON A QUADRATIC FUNCTION STIMULATION

Zbigniew Czaja

Abstract

A new approach to self-testing of the analog parts of mixed-signal electronic systems controlled by microcontrollers equipped with an ADC and a DAC is presented. It is based on a BIST and a new fault diagnosis method. A novelty is the use of the DAC as a component of the BIST, allowing to generate a stimulating signal with a quadratic function shape. It contributes to a better extraction of information about the state of the circuit under test.

Keywords

microcontrollers, ADCs, DACs, self-testing, BISTs

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IMEKO-WC-2015-TC4-109.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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