A METHOD OF SELF-TESTING OF ANALOG CIRCUITS BASED ON FULLY DIFFERENTIAL OP-AMPS WITH TCBF CLASSIFIER

Zbigniew Czaja, Michał Kowalewski

Abstract

A new approach of self-testing of analog circuits based on fully differential op-amps of mixed-signal systems controlled by microcontrollers is presented. It consists of a measurement procedure and a fault diagnosis procedure. We measure voltage samples of a time response of a tested circuit on a stimulation of a unit step function given at the common-mode reference voltage input of the op-amp. The fault detection and fault localization is carried out by the TCBF neural network classifier.

Keywords

neural classifiers, self-testing, microcontrollers, fully differential op-amps

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IMEKO-WC-2015-TC4-110.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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