OPTIMIZATION OF REQUIREMENTS FOR METROLOGICAL SUPERVISION PROCESS IN INDUSTRY OR LABORATORY

Asta Meskuotiene, Justina Dobilienė, Simas Joneliūnas

Abstract

This paper presents comprehensive attitude to measurement process. Detailed model of metrological supervision can be applied in every industrial enterprise that seeks reliable results solving measurements traceability problem. Optimization of measuring instruments characteristics and created model of metrological supervision can ensure efficient use of these devices in technological process or laboratory. This research is the basis for database structure creation.

Keywords: metrological supervision for industry, legal and industrial metrology, measurement standards, calibration, verification
Download: IMEKO-WC-2015-TC11-247.pdf
DOI: -
IMEKO TC: TC11 - Measurement in Testing, Inspection and Certification

Event details

Event: XXI IMEKO World Congress
Place: Prague, CZECH REPUBLIC
Time: 30 August 2015 - 4 September 2015
Website: http://imeko2015.org/

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