CHARACTERIZATION OF THE METROLOGICAL STRUCTURAL RESOLUTION OF CT SYSTEMS USING A MULTI-WAVE STANDARD

Francisco A. Arenhart, Vitor C. Nardelli, Gustavo D. Donatelli

Abstract

This paper presents a method and procedure for characterizing the metrological structural resolution (MSR) of CT systems. The method is based on the frequency response analysis on sinusoidal surfaces. The procedure involves performing evaluations with multiple voxel sizes. To test the method, a comparative evaluation of two CT measuring systems was performed. The results demonstrate the potential of the proposal for assessing the metrological structural resolution of CT systems.

Keywords

dimensional metrology, computed tomography, surface extraction, structural resolution, transfer function

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IMEKO-WC-2015-TC14-282.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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