PARAMETER DESIGN FOR METROLOGICAL CHARACTERISTICS IMPROVEMENT OF A FAST DIGITAL INTEGRATOR AT CERN

Pasquale Arpaia, David Giloteaux, Giuseppe Lucariello, Giovanni Spiezia

Abstract

The reduction of uncertainty in measurement systems is usually obtained through the use of more accurate components. In this paper, this problem is faced by a statistical parameter design procedure. The proposed method is shown to be effective to improve the metrological characteristics of a Fast Digital Integrator developed at European Centre of Nuclear Research.

Keywords

uncertainty reduction, parameter design, fast digital integrator

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PWC-2006-TC4-036u.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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