METROLOGICAL PERFORMANCE OF INTEGRATED MULTIPLE AXIS MEMS ACCELEROMETERS UNDER THERMAL EFFECT
Abstract
Microelectromechanical system (MEMS) accelerometers are widely used for the measurement of acceleration, tilt, vibration, and shock in moving objects. MEMS-based accelerometers are rather sensitive to the temperature changes. The paper presents the dependence between the temperature changes and metrological performance of MEMS-based accelerometer. Methods of the temperature compensation are considered in this paper.
Event details
- Event
- XXI IMEKO World Congress
- Place
- Prague, CZECH REPUBLIC
- Time
- 30 August 2015 - 4 September 2015
- Website
- http://imeko2015.org/