Parameterization of Nonlinearity for Efficient Estimation in ADC Testing

Tamás Virosztek, István Kollár

Abstract

In Maximum Likelihood (ML) estimation of ADC parameters, the estimation of static transfer characteristic has key importance. However, the description of static transfer characteristic demands to handle numerous values. Without parameterization, the nonlinearity of an N-bit converter can be described using 2^N - 1 integral nonlinearity (INL) values. Nevertheless for real ADCs the INL values are not independent, the information regarding the nonlinearity can be compressed. This paper enumerates multiple methods to measure and approximate the static transfer characteristic of the ADCs, and evaluates their efficiency. The results are expressed paying attention to the number of parameters and using standard measures for the approximation error (e.g. the l_∞ norm of the error vector).

Keywords

ADC testing, parameterization, INL, estimation, maximum likelihood

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IMEKO-TC4-2016-15.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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