Knife Edge Diffraction for Spatially Extended Light Sources

Christian Mentin, Robin Priewald, Eugen Brenner

Abstract

The position of an object’s edge can be determined from its shadow projected onto a CCD or CMOS sensor without any additional optical elements such as lenses. Nevertheless, in many applications a collimated Laser light beam is used to illuminate the measured object. Since laser diodes are often complicated in handling, and mostly need additional expensive Laser driver hardware, new approaches were considered. Spatially extended light sources such as off-the-shelf LEDs could be used for edge detection in combination with diffraction pattern analysis, without the need of any additional collimation optics for illumination. Results and applicability for simple position measurement are discussed.

Keywords

CCD Sensor, Knife Edge Diffraction

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IMEKO-TC4-2016-26.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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