HIL test based non-intrusive diagnostics of cyber-physical systems

Balázs Scherer

Abstract

Cyber-physical systems have extensive contact with the physical world. Usually during the development of these systems, the testing phase cannot be done efficiently or safely in the complete real environment, and therefore HIL (Hardware In the Loop) simulators are used. During HIL testing, diagnostic protocols are used very often to gather detailed information about the DUT’s (Device Under Test) internal state. Diagnostic protocols are very useful during testing, but they cause a significant load to the DUT. This paper introduces a novel approach to replace traditional diagnostic protocols with a nonintrusive solution. The presented method is based on the debug capabilities of modern ARM Cortex M core microcontroller, and uses a CMSIS-DAP (Cortex Microcontroller Software Interface Standard Debug - Access Port) based interface.

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IMEKO-TC10-2017-013.pdf

DOI

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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