On-component multilayer tri-axial capacitive probe for clearance measurement

Tommaso Addabbo, Francesco Bertocci, Ada Fort, Marco Mugnaini, Valerio Vignoli, Chiara Cinelli

Abstract

In this paper, an on-component triaxial capacitive probe for clearance measurement (static and dynamic measurement of distance) is proposed and studied. The device is designed to be deposited onto machinery components or complex structures and is aimed at reducing the impact of probe mounting on the monitored component. The problem is discussed from a theoretical point a view and then supported by the development of a prototype in screen printed technology. The results prove the feasibility of this innovative device.

Download

IMEKO-TC10-2017-025.pdf

DOI

-

IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

Back to the proceedings