3D Imaging of Paintings by Scanning with a Portable EDXRF-Device

Roberto Cesareo, Stefano Ridolfi, Antonio Brunetti, Ricardo T. Lopes, Giovanni E. Gigante

Abstract

3D map of chemical elements distribution from energy dispersive X-ray fluorescence (EDXRF) analysis would be a perfect conclusion to study in detail any type of artifact. This map can be easily achieved by using synchrotron light as source of radiation, and micro-optics both at the source and at the detector. In such a manner a micro-voxel is irradiated and detected, which can be at any depth with respect to the surface of the artifact. This method is effective but needs a synchrotron; therefore its use in archaeometry is greatly limited. An alternative method is proposed in the present paper, which uses the altered Kα/Kβ or Lα/Lβ-ratios to localize the chemical elements. This method employs a portable EDXRF-device, characterized by a small size X-ray tube and a Si-drift detector. Several examples are described.

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IMEKO-TC4-ARCHAEO-2017-048.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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