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SI, BIPM, RMOs, NMIs. WHAT NEXT?

António Cruz, Eduarda Filipe

Abstract

The organizations responsible for the maintenance of the measuring standards according the SI at international, regional and national levels are facing new challenges. A worldwide efficient and transparent metrology requires a new model of organization. The authors give an overview of the actual challenges and explain their thinking about where to go and how to built up it in the future.

Keywords
SI, BIPM, metrology
Download
PWC-2006-TC8-015u.pdf
DOI
-
IMEKO TC
TC8 - Traceability in Metrology

Event details

Event
XVIII IMEKO World Congress
Place
Rio de Janeiro, BRAZIL
Time
17 September 2006 - 22 September 2006
Website
http://www.metrologia2006.org.br

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