AUTO-CORRECTION AND DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS

Uwe Frühauf, Ernst-Georg Kranz, Hellmut Leuterer

Abstract

For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and utocorrection, including methods of design-for-testability in analogue circuits.

Keywords

Embedded measurement system, autocorrection, Design-for-testability, analogue Boundary-Scan, evaluation system

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IMEKO-TC4-2002-120.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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