TESTING VLSI CIRCUIT USING ARTIFICIAL IMMUNE SYSTEM

C. P. Souza, R. C. S. Freire, F. M. Assis

Abstract

A VLSI circuit test scheme taking inspiration from the Human Immune System is presented. Such a scheme is based on the Negative-Selection Mechanism which provides the human body with the capability to discriminate between the self (body’s own cell) and any foreign cell (non-self). Based on this, it is design a output response analyzer which is able to evaluate is the circuit is faulty. Experimental results showing the effectively of the proposed scheme are presented.

Keywords

VLSI circuit testing, output response analyzer, artificial immune system

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PWC-2006-TC10-002u.pdf

DOI

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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