Skip to main content

DAC testing: recent research directions

E. Balestrieri, P. Daponte, L. De Vito, F. Picariello, S. Rapuano, I. Tudosa

Abstract

Digital to Analog Converters (DACs) represent essential components in many applications. During the years, their performances have been improved hand in hand with the increasing need to accurately test them. Due to the large number of different DAC applications, several different specifications have been used to quantify the effective performance of these converters in a particular context. To unambiguously clarify DAC terms, definitions and test methods the IEEE Std. 1658 has been developed and is currently under revision. The paper presents an overview of the last research work dealing with the DAC testing to highlight the trends and issues and provide useful information for the standard revision.

Keywords
DAC, test, settling time, linearity, IEEE Std. 1658 standard, nonlinearity, uncertainty
Download
IMEKO-TC4-2019-048.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
tc4-2019

Back to the proceedings