Projected Fringes Profilometry for Cultural Heritage Studies

Giuseppe Schirripa Spagnolo, Lorenzo Cozzella, Fabio Leccese

Abstract

The use of projected fringes for the measurement of surface profile is a well-developed technique. In this paper, we present a surface profile measurement method for micro-components based on the combination of digital fringe projection, phase stepping, temporal phase unwrapping, and digital image acquisition. In this paper, a cost-effective machine is proposed. In particular, the paper describes the hardware and software realization. A simple procedure is described, which enables calibration of the optical set-up for subsequent quantitative measurement of micro-components of unknown shapes. In this paper, some examples are presented to demonstrate the potentiality of the system in measurement of microscopic surface profile.

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IMEKO-TC4-METROARCHAEO-2019-85.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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