Challenges in surface metrology

V. Radhakrishnan

Abstract

In an area which has been explored and researched for many years, normally there may not be many challenges left. However, in surface metrology in which research started in a systematic fashion in the late thirties of the last centaury, there are still many challenges left and more are in the offing. The reasons for this can be seen in the development of technologies associated with this measurement and the demand from the user groups keen on getting worth while inputs for clear specification, product realization in practice and reliable applications in current and emerging areas. This paper addresses some of these challenges with specific reference to surface roughness and emerging technologies.

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IMEKO-TC14-2007-02.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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